AFM also allows thickness measurement of thin organic layers, which is extremely convenient especially for materials with low hardness. Methods that use the determination of layer thickness based on measurement of optical properties require complex calculations or are relatively time-consuming.
Using AFM, thickness measurement is simpler and faster. The measurement consists in removing the material of the layer up to the substrate material. Then, the measurement of surface topography at the boundary of the layer and the substrate is conducted. Through the linear analysis of the height change value in the topographic profile, it allows to specify the layer thickness.
However, the accuracy of the test should depend on the total exposure of the substrate and the selection of a representative place thickness test. Therefore, especially in the case of layers with complex topography, it is necessary to perform measurements several times in order to determine the statistical average [ 9 ]. Licensee IntechOpen. This chapter is distributed under the terms of the Creative Commons Attribution 3. Help us write another book on this subject and reach those readers.
Login to your personal dashboard for more detailed statistics on your publications. We are IntechOpen, the world's leading publisher of Open Access books. Built by scientists, for scientists. Our readership spans scientists, professors, researchers, librarians, and students, as well as business professionals.
Downloaded: Introduction Forming part of the group of scanning probe microscopy, the atomic force microscopy AFM allows to imaging of surface topography of all groups of engineering materials with very high resolution, relative to all three axes.
More Print chapter. How to cite and reference Link to this chapter Copy to clipboard. Available from:. Over 21, IntechOpen readers like this topic Help us write another book on this subject and reach those readers Suggest a book topic Books open for submissions. More statistics for editors and authors Login to your personal dashboard for more detailed statistics on your publications. The development of the family of scanning probe microscopes started with the original invention of the STM in This instrument would later win Binnig and Rohrer the Nobel prize in physics in The atomic force microscope AFM was developed to overcome a basic drawback with STM — it can only image conducting or semiconducting surfaces.
The AFM has the advantage of imaging almost any type of surface, including polymers, ceramics, composites, glass, and biological samples. Their original AFM consisted of a diamond shard attached to a strip of gold foil.
The diamond tip contacted the surface directly, with the interatomic van der Waals forces providing the interaction mechanism. Analogous to how an Scanning Tunneling Microscope works, a sharp tip is raster-scanned over a surface using a feedback loop to adjust parameters needed to image a surface.
For example; piezoresponse force microscopy PFM utilizes AFM microscopes to characterize the electromechanical coupling of a material system using electrical stimulation via the probe tip. This may require high tip-bias voltages to achieve suitable levels of sensitivity. Although contact mode is used less often than dynamic mode, it is ideal for measuring the electrical properties of samples during imaging as the tip can double as a nanoscale electrode.
AFM microscopes are used in many different fields, including polymer science, semiconductor devices, thin films and coatings, energy storage and energy generation materials, biomolecules, cells and tissues, and many, many others. Asylum Research specializes in the design and supply of AFM microscopes for a broad range of fields.
We supply analytical tools suitable for evaluating the local electrical properties of sample materials, providing insights in ferroelectric materials, semiconducting polymer films, novel 2D materials, and more. If you would like any more information about our AFM microscopes , please do not hesitate to contact us directly. Part of the Oxford Instruments Group Expand. Oxford Instruments. Sustainability Investors Careers News Events en.
Investors Careers. Case Studies. About Us. Sales Inquiries. Customer Support.
0コメント